Spire Solar Home
 
Spire Solar       Spire Biomedical       Spire Semiconductor       Spire R&D         

Spi-Cell Tester

Solar Cell Tester

CT 150 web.gif (20127 bytes)The Spi-Cell Tester™ tests the electrical performance of photovoltaic cells under simulated sunlight. A xenon arc lamp with an optical filter provides a close match to the Air Mass 1.5 Global solar spectrum.The simulator spectrum meets the highest International and ASTM specifications (ASTM E927 Class A).

The Spi-Cell Tester measures current-voltage (I-V) characteristics of cells with dimensions up to 210 mm x 210 mm. Its high resolution also permits testing of very small area devices. Separate current and voltage probes on the top and bottom of the cell provide four-point I-V measurements. A calibrated reference cell is located on the test plane to monitor the light intensity.

A computer with user-friendly software adjusts the lamp intensity, controls the measurement process, and acquires cell performance data. A programmable electronic load varies the resistance across the cell to measure its I-V characteristics.The computer plots the I-V curve and displays a variety of cell characteristics. Curves and data can be printed and stored on disk.

Features & Benefits

  • Measures and displays the following cell parameters:
    • Complete I-V curve
    • Open circuit voltage, Voc
    • Short-circuit current, Isc
    • Short-circuit current density, Jsc
    • Peak power, Pmp
    • Cell efficiency, η
    • Fill factor, FF
    • Series resistance, Rs
    • Shunt resistance, Rsh
    • Cell temperature, °C
  • Four-point test probes and temperature controlled vacuum chuck Illumination uniformity within ±2%
  • Xenon light source, filtered to Class A spectrum, with intensity from 70 to 110 mW/cm²
  • Calibrated reference cell, traceable to NREL standard
  • Four-point probe for accurate measurements
  • Temperature controlled vacuum chuck
  • Computer system and software package for operation, measurements, data analysis, printed output, and disk storage

Options

  • Filtered calibrated reference cell for testing amorphous silicon devices
  • Laser printer with software
  • Bins for manually sorting cells
  • Software for Dark I-V measurement

Certifications

CE
STR-R ISO9001-2000

Spire in partnership with Nisshinbo, offers this product worldwide.
Spire in partnership with Nisshinbo, offers this product worldwide.


Brochures and Request Information

Brochures

View a list of available brochures and contact Spire for more information. More »