High Resolution Inspection for Solar Modules
The Spi-EL series of solar module testers uses electroluminescence (EL) measurements to identify microcracks and other invisible defects in modules. The testers utilize cooled near-infrared CCD camera technology to image each solar cell with resolutions as fine as 170μm per pixel, which is equivalent to a 60 megapixel image for an entire module. Spire’s EL systems are available in either stand-alone or in-line configurations and can be easily integrated into any environment from R&D to high volume production. Modules are easily loaded/unloaded using standard conveyors. With image capture times as fast as 10 seconds and total test times of less than 30 seconds (including loading/unloading), 100% inline EL inspection can satisfy the module line speed required by today’s high vloume production. Systems incorporate a user-friendly computer interface for easy operation and offer the option of automatic electrical connection to the module.
Features and Benefits
- Reveals invisible defects such as microcracks, finger defects, and dark areas
- Improves line yield by identifying defective modules before lamination
- Improves quality and reliability of final product
- Highest available resolution
- Flexible system can be used to test framed or unframed modules, before or after lamination
- Additional large area models available
- Small system footprint minimizes floorspace requirements
- Automated module loading/unloading simplifies operation
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